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Advanced Transmission Electron Microscope
Facility name
Hosting Legal Entity
Institute for Basic Science (IBS)
Contact
beautiful@ibs.re.kr  Send E-Mail
RI Category
Analytical Facilities
RI Keywords
Transmission electron microscope, Spherical Aberration Correction, Organic Nano Structure Analysis, Cryogenic experiment
TRL
  1. Basic Technology
    Research
    1단계 2단계
  2. Research to Prove
    Feasibility
    3단계 4단계
  3. Technology
    Demonstration
    5단계 6단계
  4. System/Subsystem
    Development
    7단계 8단계
  5. System Test
    Launch &
    Operaions
    9단계
Description
3 DAY + 1PREP

Equipment that analyzes the specimen by obtaining the result of bright field image, dark field image, diffraction pattern, etc. when the electron beam passes through the specimen and the transmission line and diffraction line come out. Acceleration voltage of electron beam can be used from 60 kV to 300 kV, and it is equipped with cryo-shield, so it can analyze samples at low temperature. Therefore, in order to analyze organic and organic / inorganic hybrid materials that were previously difficult to analyze due to the damage caused by high energy electron beams on the specimens, suitable acceleration voltages can be used flexibly and the specimens are disturbed by the growth of ice crystals at cryogenic temperatures. It is a transmission electron microscope that can be analyzed without receiving.
Application Area
It is used in various research fields such as chemistry, new materials engineering, polymer science, and steel business
Specifications

Equipment Component

Equipment Component

Provide name and model item

Name Model
Advanced Transmission Electron Microscope Titan G2 60-300 | FEI

location

Pohang, Korea

Photos

  • 회전_Cap 2014-12-30 17-25-22-352.jpg