LARGE FACILITY IN KOREA
Advanced Transmission Electron Microscope
- Hosting Legal Entity
- Institute for Basic Science (IBS)
- Contact
- beautiful@ibs.re.kr Send E-Mail
- RI Category
- Analytical Facilities
- RI Keywords
- Transmission electron microscope, Spherical Aberration Correction, Organic Nano Structure Analysis, Cryogenic experiment
- TRL
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Basic Technology
Research 1단계 2단계 -
Research to Prove
Feasibility 3단계 4단계 -
Technology
Demonstration 5단계 6단계 -
System/Subsystem
Development 7단계 8단계 -
System Test
Launch &
Operaions 9단계
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Basic Technology
- Description
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3 DAY + 1PREP
Equipment that analyzes the specimen by obtaining the result of bright field image, dark field image, diffraction pattern, etc. when the electron beam passes through the specimen and the transmission line and diffraction line come out. Acceleration voltage of electron beam can be used from 60 kV to 300 kV, and it is equipped with cryo-shield, so it can analyze samples at low temperature. Therefore, in order to analyze organic and organic / inorganic hybrid materials that were previously difficult to analyze due to the damage caused by high energy electron beams on the specimens, suitable acceleration voltages can be used flexibly and the specimens are disturbed by the growth of ice crystals at cryogenic temperatures. It is a transmission electron microscope that can be analyzed without receiving.
- Application Area
- It is used in various research fields such as chemistry, new materials engineering, polymer science, and steel business
- Specifications
Equipment Component
| Name | Model |
|---|---|
| Advanced Transmission Electron Microscope | Titan G2 60-300 | FEI |
location
Pohang, Korea
